Nikon Company (Nikon) has unveiled its new video measuring system, the NEXIV VMF-Ok Collection. Designed to fulfill the calls for of semiconductor and digital part inspection, the brand new answer builds upon the success of its predecessor, the VMZ-Ok Collection. The brand new answer gives advantages for numerous industries, akin to semiconductor manufacturing, superior packaging, substrate manufacturing, wafer inspection, and probe card inspection.
With semiconductors changing into smaller and extra built-in, extra calls for are being positioned on inspection processes to make sure high quality ranges. The NEXIV VMF-Ok Collection may help present steady measurements at micron-level dimensions to enhance throughput and help high-quality management ranges in semiconductor machine manufacturing.
The brand new Collection consists of the VMF-K3040, which replaces the VMZ-K3040, in addition to the VMF-K6555, which replaces the VMZ-K6555.
Key advantages of the NEXIV VMF-Ok Collection:
- Improved measurement throughput: With roughly 1.5 instances increased measurement throughput in comparison with its predecessor (in accordance with Nikon’s commonplace measuring circumstances), the answer reduces measurement time and enhances productiveness.
- Larger optics: Utilizing a confocal optical system, the brand new Collection permits for simultaneous 2D and top measurement inside the discipline of view. This can enhance throughput in comparison with top measurement utilizing solely bright-field photos.
- Enhanced mild supply: Altering the confocal mild supply from a xenon lamp to an LED has elevated the lifespan from 3,000 hours to 30,000 hours, offering enhancements in operational effectivity whereas decreasing the necessity for lamp replacements.
- Expanded line-up: The brand new standardised 45x goal lens mannequin helps even finer superior semiconductor measurements.
- SEMI S2/S8 compliance: The brand new Collection meets {industry} security requirements for semiconductor manufacturing tools following the SEMI S2/S8 tips.
- New features and design: The answer can show the time remaining throughout measurement. The NEXIV VMF-Ok Collection additionally contains a new design with black and silver tones.
“We’re delighted to introduce the NEXIV VMF-Ok Collection, an industry-leading answer that addresses the rising wants for high-speed, finer measurement in semiconductor and digital part manufacturing,” stated a Nikon spokesperson. “By considerably bettering measurement throughput and sustaining excessive accuracy, our new system empowers producers to boost their high quality management processes and speed up product improvement within the face of accelerating miniaturisation and integration of semiconductor gadgets.”