Fast availability, glorious temperature stability, humidity resistance, new from PI.
PI, a world chief in precision movement management and nanopositioning, is extending the capabilities of its famend PICMA® piezo stack actuator sequence with the introduction of the brand new PICMA® Plus actuators. Whereas the usual PICMA® actuators are already celebrated for his or her lengthy lifetime, excessive stiffness, microsecond response instances, and sub-nanometer decision, the PICMA® Plus line represents a big development by providing considerably better displacement.
Prolonged Displacement With out Sacrifice
Beforehand, PI’s shortly out there PICMA® piezo actuators offered displacement ranges from 6.5 microns to 36 microns per monolithic stack. The brand new PICMA® Plus actuators construct upon this confirmed basis by delivering even longer journey ranges as much as 43 microns, permitting for functions requiring bigger displacement in the identical package deal measurement, with out sacrificing the core advantages of the PICMA® know-how.
Area-Confirmed Expertise – Excessive Lifetime and Working Temperature Vary
Each the unique and the brand new PICMA® Plus actuators share the identical patented, ceramic-encapsulation course of. This proprietary, polymer-free, all-ceramic insulation is what units PI’s actuators aside from typical, polymer-insulated piezo actuators, that are inclined to humidity and temperature fluctuations. This sturdy ceramic encapsulation ensures superior sturdiness and reliability, as demonstrated by NASA/JPL’s 100 billion cycle take a look at for the Mars rover Curiosity. The PICMA® know-how, together with the brand new Plus variants, continues to supply humidity resistance and a large working temperature vary from -40 °C to 150 °C, and as much as 200 °C for modified variations, making them superb for difficult environments.
Industries Served
Micro-manufacturing, nano-dispensing, optics & photonics, semiconductor take a look at gear, astronomy, biotechnology, floor metrology, high quality assurance, nanometrology, nanopositioning
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